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Ion beam analysis, corrosion resistance and nanomechanical properties of TiAlCN/CNx multilayer grown by reactive magnetron sputtering
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Ion beam analysis, corrosion resistance and nanomechanical properties of TiAlCN/CNx multilayer grown by reactive magnetron sputtering

Alemón, B. ; Flores, M. ; Canto, C. ; Andrade, E. ; de Lucio, O.G. ; Rocha, M.F. ; Broitman, E.

Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 2014-07, Vol.331, p.134-139 [Periódico revisado por pares]

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2
Ion beam analysis at the University of Mexico
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Ion beam analysis at the University of Mexico

Andrade, E.

Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 1991-05, Vol.56, p.802-805 [Periódico revisado por pares]

Elsevier B.V

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3
Ion beam analysis of high pressure deposition of epitaxial PZT thin films
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Ion beam analysis of high pressure deposition of epitaxial PZT thin films

Andrade, E. ; Blanco, O. ; de Lucio, O.G. ; Solis, C. ; Rocha, M.F. ; Zavala, E.P.

Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 2010-06, Vol.268 (11), p.1964-1966 [Periódico revisado por pares]

Elsevier B.V

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4
Elemental depth profiles of MgB2/Si precursor and superconducting films
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Elemental depth profiles of MgB2/Si precursor and superconducting films

Andrade, E. ; Chromik, Š. ; Jergel, Mi ; Jergel, Ma ; Falcony, C. ; Štrbı́k, V. ; Rocha, M.F.

Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 2004-06, Vol.219-220, p.768-772 [Periódico revisado por pares]

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5
Ion beam analysis of TiN/Ti multilayers deposited by magnetron sputtering
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Ion beam analysis of TiN/Ti multilayers deposited by magnetron sputtering

Andrade, E. ; Flores, M. ; Muhl, S. ; Barradas, N.P. ; Murillo, G. ; Zavala, E.P. ; Rocha, M.F.

Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 2004-06, Vol.219, p.763-767 [Periódico revisado por pares]

Elsevier B.V

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6
Ion beam analysis of copper selenide thin films prepared by chemical bath deposition
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Ion beam analysis of copper selenide thin films prepared by chemical bath deposition

Andrade, E. ; Garcı́a, V.M. ; Nair, P.K. ; Nair, M.T.S. ; Zavala, E.P. ; Huerta, L. ; Rocha, M.F.

Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 2000-03, Vol.161, p.635-640 [Periódico revisado por pares]

Elsevier B.V

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7
Ion beam analysis of HTc superconducting Tl-based films
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Ion beam analysis of HTc superconducting Tl-based films

Andrade, E. ; Jergel, M. ; Cheang-Wong, J.C. ; Conde-Gallardo, A. ; Falcony, C.

Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 1997-03, Vol.122 (4), p.677-684 [Periódico revisado por pares]

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8
IBA analysis of a possible therapeutic ancient tooth inlay
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IBA analysis of a possible therapeutic ancient tooth inlay

Andrade, E. ; Pineda, J.C. ; Zavala, E.P. ; Murillo, G. ; Chavez, R. ; Lazcurain, R. ; Espinosa, Ma.L. ; Villanueva, O.

Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 1998-03, Vol.136, p.908-912 [Periódico revisado por pares]

Elsevier B.V

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9
IBA of ZrO2:Yb/Si thin films produced by the spray pyrolysis method
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IBA of ZrO2:Yb/Si thin films produced by the spray pyrolysis method

Andrade, E. ; Ramirez, E.B. ; Alonso, J.C. ; Rocha, M.F.

Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 2008-05, Vol.266 (10), p.2433-2436 [Periódico revisado por pares]

Elsevier B.V

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10
Ion beam analysis of partial lithium extraction of LiMn2O4 by chemical delithiation
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Ion beam analysis of partial lithium extraction of LiMn2O4 by chemical delithiation

Andrade, E ; Romero Nunez, A ; Ibarra Palos, A ; Cruz, J ; Rocha, M F ; Solis, C ; de Lucio, OG ; Zavala, E P

Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 2011-02, Vol.269 (4), p.440-443 [Periódico revisado por pares]

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