Result Number | Material Type | Add to My Shelf Action | Record Details and Options |
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1 |
Material Type: Ata de Congresso
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EMC Allocation in System Budget DesignAasen, Marvin D.1975 IEEE International Symposium on Electromagnetic Compatibility, 1975, p.1-5IEEETexto completo disponível |
2 |
Material Type: Ata de Congresso
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Shell Instability Problems as Related to DesignAbraham, Lewis H. ; Lowy, Mortimer J.Langley Research Center: National Aeronautics and Space Administration 1962Texto completo disponível |
3 |
Material Type: Ata de Congresso
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Collected Papers on Stability of Shell Structures - 1962Abraham, Lewis H. ; Lowy, Mortimer J. ; Kaplan, A. ; Morgan, E. J. ; Zophres, W. ; Brush, D. O. ; Hausrath, A. H. ; Dittoe, F. A. ; James B. Sterett, Jr ; Moseley, W. M. ; Hedgepeth, John M. ; Schleicher, Richard L. ; Walter E. Binz, Jr ; Dill, Ellis Harold ; Langhaar, H. ; Boresi, A. ; Babcock, C. D. ; Sechler, E. E. ; Reyno!ds, Thomas E. ; Lee, L. H. N. ; Ricardo, Octavlo G. S. ; Kempner, Joseph ; Lu, S. Y. ; Nash, William A. ; Thielemann, W. F. ; Stein, Manuel ; DeHart, Robert C. ; Basdekas, Nicholas L. ; Anderson, Melvin S. ; Johns, David J. ; Gerard, George ; Card, Michael F. ; Peterson, James P. ; Neut, Arie van der ; Kuenzi, Edward W. ; Harris, Leonard A. ; Baker, Edward H. ; Cunningham, John H. ; Jacob, Marcus J. ; Coppa, Anthony P. ; Seide, Paul ; Radkowski, P. P. ; Bijlaard, P. P. ; Newman, Malcolm ; Reiss, Edward L. ; Singe, Josef ; Weinitschke, Hubertus J. ; Parmerter, R. R. ; Fung, Y. C. ; Keller, Herbert B. ; Reiss, Edward L.Langley Research Center: National Aeronautics and Space Administration 1962Texto completo disponível |
4 |
Material Type: Ata de Congresso
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M.S. program with specialization in computers: department of electrical engineeringAbrams, M. D. ; Pugsley, J. H.SIGCSE bulletin, 1971, Vol.3 (3), p.25-37Texto completo disponível |
5 |
Material Type: Ata de Congresso
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Multimode Dielectric Waveguide for Optical CommunicationsAcharekar, M. A.1974 IEEE Electromagnetic Compatibility Symposium Record, 1974, p.1-4IEEETexto completo disponível |
6 |
Material Type: Ata de Congresso
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Transfer Impedance Measurement as a Test for Electromagnetic CompatibilityAcuna, Victor E.1975 IEEE International Symposium on Electromagnetic Compatibility, 1975, p.1-5IEEETexto completo disponível |
7 |
Material Type: Ata de Congresso
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Electric and Magnetic Near Fields of Arrays of Straight Skewed WiresAdams, A. T. ; Baldwin, Thomas E. ; Warren, Daniel E.1972 IEEE International Electromagnetic Compatibility Symposium Record, 1972, p.1-6IEEETexto completo disponível |
8 |
Material Type: Ata de Congresso
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Random Effects in Planar Arrays of DipolesAdams, A. T. ; Hsi, P. ; Farrar, A.IEEE 1976 International Symposium on Electromagnetic Compatibility, 1976, p.1-6IEEETexto completo disponível |
9 |
Material Type: Ata de Congresso
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Modern Analysis Methods for EMCAdams, A. T. ; Strait, B. J.1970 IEEE Electromagnetic Compatibility Symposium Record, 1970, p.1-11IEEETexto completo disponível |
10 |
Material Type: Ata de Congresso
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Aperture Coupling by Matrix MethodsAdams, A. T. ; Varnado, C. Bruce ; Warren, Daniel E.1973 1EEE International Electromagnetic Compatibility Symposium Record, 1973, p.1-15IEEETexto completo disponível |