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1
Copper oxide based low cost thin film solar cells
Material Type:
Acta de Congreso
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Copper oxide based low cost thin film solar cells

Kumar, V. ; Masudy-Panah, S. ; Tan, C. C. ; Wong, T. K. S. ; Chi, D. Z. ; Dalapati, G. K.

2013 IEEE 5th International Nanoelectronics Conference (INEC), 2013, p.443-445

IEEE

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2
Investigation of work function and surface energy of aluminum: An ab-initio study
Material Type:
Acta de Congreso
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Investigation of work function and surface energy of aluminum: An ab-initio study

Cheng, Shuguang ; Ming Tan, Cher ; Deng, Tianqi ; He, Feifei ; Zhang, Shuai ; Su, Haibin

2013 IEEE 5th International Nanoelectronics Conference (INEC), 2013, p.473-475

IEEE

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3
Impact of metal contact on the performance of cupric oxide based thin film solar cells
Material Type:
Acta de Congreso
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Impact of metal contact on the performance of cupric oxide based thin film solar cells

Masudy-Panah, S. ; Kumar, V. ; Tan, C. C. ; Radhaknshnan, K. ; Chi, D. Z. ; Dalapati, G. K.

2013 IEEE 5th International Nanoelectronics Conference (INEC), 2013, p.378-380

IEEE

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4
Growth control of CuO nanowires on copper thin films: Toward the development of pn nanojunction arrays
Material Type:
Acta de Congreso
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Growth control of CuO nanowires on copper thin films: Toward the development of pn nanojunction arrays

Mel, A. A. E. ; Buffiere, M. ; Bouts, N. ; Gautron, E. ; Bittencourt, C. ; Guttmann, P. ; Tessier, P. Y. ; Konstantinidis, S. ; Snyders, R.

2013 IEEE 5th International Nanoelectronics Conference (INEC), 2013, p.201-202

IEEE

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5
Retention behavior of graphene oxide resistive switching memory on flexible substrate
Material Type:
Acta de Congreso
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Retention behavior of graphene oxide resistive switching memory on flexible substrate

Yuan, Fang ; Ye, Yu-Ren ; Wang, Jer-Chyi ; Zhang, Zhigang ; Pan, Liyang ; Xu, Jun ; Lai, Chao-Sung

2013 IEEE 5th International Nanoelectronics Conference (INEC), 2013, p.288-290

IEEE

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6
The temperature dependent TCAD and SPICE modeling of AlGaN/GaN HEMTs
Material Type:
Acta de Congreso
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The temperature dependent TCAD and SPICE modeling of AlGaN/GaN HEMTs

Li Yuan ; Weizhu Wang ; Kean Boon Lee ; Haifeng Sun ; Selvaraj, S. L. ; Xing Zhou ; Guo-Qiang Lo

2013 IEEE 5th International Nanoelectronics Conference (INEC), 2013, p.115-118

IEEE

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7
Fabrication of highly ordered hollow oxide nanostructures based on nanoscale Kirkendall effect and ostwald ripening
Material Type:
Acta de Congreso
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Fabrication of highly ordered hollow oxide nanostructures based on nanoscale Kirkendall effect and ostwald ripening

Mel, A. E. ; Buffiere, M. ; Tessier, P. ; Wei Xu ; Ke Du ; Chang-Hwan Choi ; Konstantinidis, S. ; Bittencourt, C. ; Snyders, R.

2013 IEEE 5th International Nanoelectronics Conference (INEC), 2013, p.46-48

IEEE

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8
On controlling EBL parameters for nanoelectromechanical resonators fabricated on insulating/semiconducting structures
Material Type:
Acta de Congreso
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On controlling EBL parameters for nanoelectromechanical resonators fabricated on insulating/semiconducting structures

Dow, A. B. A. ; Lin, H. ; Popov, C. ; Schmid, U. ; Kherani, N. P.

2013 IEEE 5th International Nanoelectronics Conference (INEC), 2013, p.318-321

IEEE

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9
Accurate numerical model for surface scattering, grain boundary scattering, and anomalous skin effect of copper wires
Material Type:
Acta de Congreso
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Accurate numerical model for surface scattering, grain boundary scattering, and anomalous skin effect of copper wires

Abbaspour, E. ; Sarvari, R. ; Akbarzadeh, A. ; Rostami, M.

2013 IEEE 5th International Nanoelectronics Conference (INEC), 2013, p.209-210

IEEE

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10
Optimization of Al-doped zinc oxide grown on sapphire using dual-plasma-enhanced metal organic chemical vapor deposition for InGaN/GaN light-emitting diodes
Material Type:
Acta de Congreso
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Optimization of Al-doped zinc oxide grown on sapphire using dual-plasma-enhanced metal organic chemical vapor deposition for InGaN/GaN light-emitting diodes

Lei, Po-Hsun ; Hsu, Chia-Ming ; Lin, Chia-Te ; Fan, Yu-Siang ; Ye, Sheng-Jhan

2013 IEEE 5th International Nanoelectronics Conference (INEC), 2013, p.187-188

IEEE

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