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1
Direct‐laser writing of silicon microstructures: Raman microprobe diagnostics and modeling of the nucleation phase of deposition
Direct‐laser writing of silicon microstructures: Raman microprobe diagnostics and modeling of the nucleation phase of deposition
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Direct‐laser writing of silicon microstructures: Raman microprobe diagnostics and modeling of the nucleation phase of deposition

Herman, Irving P. ; Magnotta, Frank ; Kotecki, David E.

Journal of vacuum science & technology. A, Vacuum, surfaces, and films, 1986-05, Vol.4 (3), p.659-664 [Periódico revisado por pares]

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2
On structure and properties of sputtered Ti and Al based hard compound films
On structure and properties of sputtered Ti and Al based hard compound films
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On structure and properties of sputtered Ti and Al based hard compound films

Knotek, O. ; Böhmer, M. ; Leyendecker, T.

Journal of vacuum science & technology. A, Vacuum, surfaces, and films, 1986-11, Vol.4 (6), p.2695-2700 [Periódico revisado por pares]

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3
Industrial deposition of binary, ternary, and quaternary nitrides of titanium, zirconium, and aluminum
Industrial deposition of binary, ternary, and quaternary nitrides of titanium, zirconium, and aluminum
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Industrial deposition of binary, ternary, and quaternary nitrides of titanium, zirconium, and aluminum

Knotek, O. ; Münz, W. D. ; Leyendecker, T.

Journal of vacuum science & technology. A, Vacuum, surfaces, and films, 1987-07, Vol.5 (4), p.2173-2179 [Periódico revisado por pares]

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4
Comparison of M‐region x‐ray and Auger electron spectra for near‐threshold electron excitation of metallic and oxidized lanthanum
Comparison of M‐region x‐ray and Auger electron spectra for near‐threshold electron excitation of metallic and oxidized lanthanum
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Comparison of M‐region x‐ray and Auger electron spectra for near‐threshold electron excitation of metallic and oxidized lanthanum

Wachter, Joseph R. ; Liefeld, Robert J.

Journal of vacuum science & technology. A, Vacuum, surfaces, and films, 1989-03, Vol.7 (2), p.249-252 [Periódico revisado por pares]

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