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Single Event Upsets in Deep-Submicrometer Technologies Due to Charge Sharing
Single Event Upsets in Deep-Submicrometer Technologies Due to Charge Sharing
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Single Event Upsets in Deep-Submicrometer Technologies Due to Charge Sharing

Amusan, O.A. ; Massengill, L.W. ; Baze, M.P. ; Sternberg, A.L. ; Witulski, A.F. ; Bhuva, B.L. ; Black, J.D.

IEEE transactions on device and materials reliability, 2008-09, Vol.8 (3), p.582-589 [Periódico revisado por pares]

New York: IEEE

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On-Chip Characterization of Single-Event Transient Pulsewidths
On-Chip Characterization of Single-Event Transient Pulsewidths
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On-Chip Characterization of Single-Event Transient Pulsewidths

Narasimham, B. ; Ramachandran, V. ; Bhuva, B.L. ; Schrimpf, R.D. ; Witulski, A.F. ; Holman, W.T. ; Massengill, L.W. ; Black, J.D. ; Robinson, W.H. ; McMorrow, D.

IEEE transactions on device and materials reliability, 2006-12, Vol.6 (4), p.542-549 [Periódico revisado por pares]

New York: IEEE

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3
Mitigation Techniques for Single-Event-Induced Charge Sharing in a 90-nm Bulk CMOS Process
Mitigation Techniques for Single-Event-Induced Charge Sharing in a 90-nm Bulk CMOS Process
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Mitigation Techniques for Single-Event-Induced Charge Sharing in a 90-nm Bulk CMOS Process

Amusan, O.A. ; Massengill, L.W. ; Baze, M.P. ; Bhuva, B.L. ; Witulski, A.F. ; Black, J.D. ; Balasubramanian, A. ; Casey, M.C. ; Black, D.A. ; Ahlbin, J.R. ; Reed, R.A. ; McCurdy, M.W.

IEEE transactions on device and materials reliability, 2009-06, Vol.9 (2), p.311-317 [Periódico revisado por pares]

New York: IEEE

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4
Quantifying the Reduction in Collected Charge and Soft Errors in the Presence of Guard Rings
Quantifying the Reduction in Collected Charge and Soft Errors in the Presence of Guard Rings
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Quantifying the Reduction in Collected Charge and Soft Errors in the Presence of Guard Rings

Narasimham, B. ; Shuler, R.L. ; Black, J.D. ; Bhuva, B.L. ; Schrimpf, R.D. ; Witulski, A.F. ; Holman, W.T. ; Massengill, L.W.

IEEE transactions on device and materials reliability, 2008-03, Vol.8 (1), p.203-209 [Periódico revisado por pares]

New York: IEEE

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5
Image-Guided Surgery
Image-Guided Surgery
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Image-Guided Surgery

Grimson, W. Eric L. ; Kikinis, Ron ; Jolesz, Ferenc A. ; Black, Peter McL

Scientific American, 1999-06, Vol.280 (6), p.62-69

United States: Scientific American, Incorporated

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6
Clinical cancer trials in a rural community cancer center in Southwest Oklahoma from 2000-2009
Clinical cancer trials in a rural community cancer center in Southwest Oklahoma from 2000-2009
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Clinical cancer trials in a rural community cancer center in Southwest Oklahoma from 2000-2009

Black, Kristal B ; Mccoy, Susie E ; Robin, Manal L ; Nimeh, Nadim F

Journal - Oklahoma State Medical Association, 2013-01, Vol.106 (1), p.14-18

United States

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7
Heavy Lifiting
Heavy Lifiting
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Heavy Lifiting

Black, Robert F ; Boroughs, Don L

U.S. news & world report, 1991-05, Vol.110 (17), p.52

Washington: U.S. News and World Report

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8
The hidden cost of AIDS
The hidden cost of AIDS
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The hidden cost of AIDS

Black, R F ; Collins, S ; Boroughs, D L ; Cumming-Bruce, N ; Kahn, S ; Blount, J ; Tarr, M ; Behn, S ; Hall, M

U.S. news & world report, 1992-07, Vol.113 (4), p.48-52

United States: U.S. News and World Report, L.P

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9
Harvesting a crop of sorrow. (AIDS among Ugandan coffee factory workers)
Harvesting a crop of sorrow. (AIDS among Ugandan coffee factory workers)
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Harvesting a crop of sorrow. (AIDS among Ugandan coffee factory workers)

Black, Robert F ; Collins, Sara ; Boroughs, Don L

U.S. news & world report, 1992-07, Vol.113 (4), p.57

Washington: U.S. News and World Report, L.P

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10
Cutting bitter lives short. (AIDS among Haitian cane cutters in the Dominican Republic)
Cutting bitter lives short. (AIDS among Haitian cane cutters in the Dominican Republic)
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Cutting bitter lives short. (AIDS among Haitian cane cutters in the Dominican Republic)

Black, Robert F ; Collins, Sara ; Boroughs, Don L

U.S. news & world report, 1992-07, Vol.113 (4), p.56

Washington: U.S. News and World Report, L.P

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