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Is Our Patent System Obsolete?Brady, Robert A ; Dodds, L B ; Dunn, Robert W ; Fellner, I J ; Jerome, A L ; Lynd, Robert S ; Masters, Dexter W ; Merchant, J H ; Rautenstrauch, Walter ; Stern, Bernhard JThe American scholar, 1948-12, Vol.18 (1), p.106Washington, D.C., etc: United Chapters of Phi Beta Kappa, etcTexto completo disponível |
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Problems and SolutionsNSF Class at University of California at Berkeley ; Sidney H. L. Kung ; Demir, Huseyin ; Just, Erwin ; Sivaramakrishnan, R. ; Rabinowitz, Stanley ; Edgar, Hugh M. ; Avery, Chris W. ; Pollatchek, Albert E. ; Breisch, Richard L. ; Aheart, Andrew N. ; Chand, Donald ; Chaoultea, Charles ; Kuttler, J. R. ; Dodds, Gerald C. ; Haverstick, Philip ; Lindstrom, Peter A. ; Portz, Bernard J. ; Ricardo, Henry J. ; Schleusner, John W. ; Schmeichel, E. F. ; Trigg, Charles W. ; Wardrop, R. F. ; Farrand, Rosalie ; Reich, Simeon ; Goldberg, Michael ; Beane, Donald ; Kohler, Alfred ; O'Shaughnessy, C. D. ; Corliss, George F. ; Dodes, Irving A. ; Knight, Bill ; Agargun, Mehmet ; Thomas, P. D. ; Howell, John M. ; Mosteller, Frederick ; Baum, John D. ; Flanders, Harley ; Penney, Walter ; Thompson, Graham C. ; Pantelidakis, P. G.Mathematics magazine, 1970-03, Vol.43 (2), p.102-112Taylor & FrancisTexto completo disponível |
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Problems and SolutionsDemir, Huseyin ; Just, Erwin ; Sivaramakrishnan, R. ; Rabinowitz, Stanley ; Edgar, Hugh M. ; Avery, Chris W. ; Pollatchek, Albert E. ; Breisch, Richard L. ; Aheart, Andrew N. ; Chand, Donald ; Chaoultea, Charles ; Kuttler, J. R. ; Dodds, Gerald C. ; Haverstick, Philip ; Lindstrom, Peter A. ; Portz, Bernard J. ; Ricardo, Henry J. ; Schleusner, John W. ; Schmeichel, E. F. ; Trigg, Charles W. ; Wardrop, R. F. ; Farrand, Rosalie ; Reich, Simeon ; Goldberg, Michael ; Beane, Donald ; Kohler, Alfred ; O'Shaughnessy, C. D. ; Corliss, George F. ; Dodes, Irving A. ; Knight, Bill ; Agargun, Mehmet ; Thomas, P. D. ; Howell, John M. ; Mosteller, Frederick ; Baum, John D. ; Flanders, Harley ; Penney, Walter ; Thompson, Graham C. ; Pantelidakis, P. G.Mathematics magazine, 1970-03, Vol.43 (2), p.102Texto completo disponível |
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Measuring cellular-scale nutrient distribution in algal biofilms with synchrotron confocal infrared microspectroscopyMurdock, Justin N ; Dodds, Walter K ; Reffner, John A ; Wetzel, David LSpectroscopy, 2010-10, Vol.25 (10), p.32Monmouth Junction: UBM LLCTexto completo disponível |