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From Technological Networks to Social NetworksKwang-Cheng Chen ; Mung Chiang ; Poor, H. V.IEEE journal on selected areas in communications, 2013-09, Vol.31 (9), p.548-572 [Periódico revisado por pares]IEEETexto completo disponível |
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Material Type: Artigo
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An Information Theoretic Approach to Digital Fault TestingAgrawalIEEE transactions on computers, 1981-08, Vol.C-30 (8), p.582-587 [Periódico revisado por pares]IEEETexto completo disponível |