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Report on the workshop on ion sources for hadron colliders (invited)
Report on the workshop on ion sources for hadron colliders (invited)
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Report on the workshop on ion sources for hadron colliders (invited)

Alessi, J. G.

Review of Scientific Instruments, 1998-02, Vol.69 (2), p.1040-1044 [Periódico revisado por pares]

United States

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2
Extraction of highly charged ions from the Berlin Electron Beam Ion Trap for interactions with a gas target
Extraction of highly charged ions from the Berlin Electron Beam Ion Trap for interactions with a gas target
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Extraction of highly charged ions from the Berlin Electron Beam Ion Trap for interactions with a gas target

Allen, F. I. ; Biedermann, C. ; Radtke, R. ; Fussmann, G.

Review of scientific instruments, 2006-03, Vol.77 (3), p.03B903-03B903-3 [Periódico revisado por pares]

United States: American Institute of Physics

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3
A miniature electron-beam ion source for in-trap creation of highly charged ions
A miniature electron-beam ion source for in-trap creation of highly charged ions
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A miniature electron-beam ion source for in-trap creation of highly charged ions

Alonso, J. ; Blaum, K. ; Djekic, S. ; Kluge, H.-J. ; Quint, W. ; Schabinger, B. ; Stahl, S. ; Verdú, J. ; Vogel, M. ; Werth, G.

Review of scientific instruments, 2006-03, Vol.77 (3) [Periódico revisado por pares]

United States

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4
Antiproton, positron, and electron imaging with a microchannel plate/phosphor detector
Antiproton, positron, and electron imaging with a microchannel plate/phosphor detector
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Antiproton, positron, and electron imaging with a microchannel plate/phosphor detector

Andresen, G B ; Bertsche, W ; Bowe, P D ; Bray, C C ; Butler, E ; Cesar, C L ; Chapman, S ; Charlton, M ; Fajans, J ; Fujiwara, M C ; Gill, D R ; Hangst, J S ; Hardy, W N ; Hayano, R S ; Hayden, M E ; Humphries, A J ; Hydomako, R ; Jørgensen, L V ; Kerrigan, S J ; Kurchaninov, L ; Lambo, R ; Madsen, N ; Nolan, P ; Olchanski, K ; Olin, A ; Povilus, A P ; Pusa, P ; Sarid, E ; Seif El Nasr, S ; Silveira, D M ; Storey, J W ; Thompson, R I ; van der Werf, D P ; Yamazaki, Y

Review of scientific instruments, 2009-12, Vol.80 (12), p.123701-123701 [Periódico revisado por pares]

United States

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5
Status of the PHOENIX electron cyclotron resonance charge breeder at ISOLDE, CERN
Status of the PHOENIX electron cyclotron resonance charge breeder at ISOLDE, CERN
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Status of the PHOENIX electron cyclotron resonance charge breeder at ISOLDE, CERN

Barton, Charles ; Cederkall, Joakim ; Delahaye, Pierre ; Kester, Oliver ; Lamy, Thierry ; Marie-Jeanne, Mélanie

Review of scientific instruments, 2008-02, Vol.79 (2 Pt 2), p.02A905-02A905 [Periódico revisado por pares]

United States

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6
An efficient trap for the collection of a cadmium atomic beam
An efficient trap for the collection of a cadmium atomic beam
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An efficient trap for the collection of a cadmium atomic beam

Bauman, R. P. ; Martin, N. L. S.

Review of Scientific Instruments, 1995-10, Vol.66 (10), p.4900-4901 [Periódico revisado por pares]

United States

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7
Determination of the ReA Electron Beam Ion Trap electron beam radius and current density with an X-ray pinhole camera
Determination of the ReA Electron Beam Ion Trap electron beam radius and current density with an X-ray pinhole camera
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Determination of the ReA Electron Beam Ion Trap electron beam radius and current density with an X-ray pinhole camera

Baumann, Thomas M ; Lapierre, Alain ; Kittimanapun, Kritsada ; Schwarz, Stefan ; Leitner, Daniela ; Bollen, Georg

Review of scientific instruments, 2014-07, Vol.85 (7), p.073302-073302 [Periódico revisado por pares]

United States: American Institute of Physics

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8
Electron beam ion source and electron beam ion trap (invited)
Electron beam ion source and electron beam ion trap (invited)
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Electron beam ion source and electron beam ion trap (invited)

Becker, Reinard ; Kester, Oliver

Review of scientific instruments, 2010-02, Vol.81 (2), p.02A513-02A513-4 [Periódico revisado por pares]

United States: American Institute of Physics

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9
Experimental results from the Brookhaven National Laboratory test electron beam ion source
Experimental results from the Brookhaven National Laboratory test electron beam ion source
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Experimental results from the Brookhaven National Laboratory test electron beam ion source

Beebe, E. ; Alessi, J. ; Hershcovitch, A. ; Kponou, A. ; Pikin, A. ; Prelec, K. ; Stein, P. ; Schmieder, R. W.

Review of Scientific Instruments, 1998-02, Vol.69 (2), p.640-642 [Periódico revisado por pares]

United States

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10
Very high resolution soft x-ray spectrometer for an electron beam ion trap
Very high resolution soft x-ray spectrometer for an electron beam ion trap
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Very high resolution soft x-ray spectrometer for an electron beam ion trap

Beiersdorfer, P. ; Crespo López-Urrutia, J. R. ; Förster, E. ; Mahiri, J. ; Widmann, K.

Review of Scientific Instruments, 1997-01, Vol.68 (1), p.1077-1079 [Periódico revisado por pares]

United States

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