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Online EIS and Diagnostics on Lithium-Ion Batteries by Means of Low-Power Integrated Sensing and Parametric Modeling
Online EIS and Diagnostics on Lithium-Ion Batteries by Means of Low-Power Integrated Sensing and Parametric Modeling
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Online EIS and Diagnostics on Lithium-Ion Batteries by Means of Low-Power Integrated Sensing and Parametric Modeling

Crescentini, Marco ; De Angelis, Alessio ; Ramilli, Roberta ; De Angelis, Guido ; Tartagni, Marco ; Moschitta, Antonio ; Traverso, Pier Andrea ; Carbone, Paolo

IEEE transactions on instrumentation and measurement, 2021, Vol.70, p.1-11 [Periódico revisado por pares]

New York: IEEE

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A 1.5-bit DFT Analyzer
A 1.5-bit DFT Analyzer
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A 1.5-bit DFT Analyzer

Carbone, Paolo ; Schoukens, Johan ; De Angelis, Alessio ; Moschitta, Antonio

IEEE transactions on instrumentation and measurement, 2020-10, Vol.69 (10), p.8590-8599 [Periódico revisado por pares]

New York: IEEE

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3
Further Investigation for Piecewise Sampling to Overcome Transient Effect of Staircase Waveform
Further Investigation for Piecewise Sampling to Overcome Transient Effect of Staircase Waveform
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Further Investigation for Piecewise Sampling to Overcome Transient Effect of Staircase Waveform

Zuliang Lu ; Yan Yang ; Lu Huang ; Lei Wang ; Xianlin Pan ; Jiangtao Zhang ; So, Eddy

IEEE transactions on instrumentation and measurement, 2017-06, Vol.66 (6), p.1217-1226 [Periódico revisado por pares]

New York: IEEE

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4
Frequency-Interleaved ADCs With Adaptive Blind Cyclic Calibration
Frequency-Interleaved ADCs With Adaptive Blind Cyclic Calibration
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Frequency-Interleaved ADCs With Adaptive Blind Cyclic Calibration

Song, Jinpeng ; Hu, Yu-Hen ; An, Jianping

IEEE transactions on instrumentation and measurement, 2020-12, Vol.69 (12), p.9427-9440 [Periódico revisado por pares]

IEEE

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5
Effects of Real Instrument on Performance of an Energy Detection-Based Spectrum Sensing Method
Effects of Real Instrument on Performance of an Energy Detection-Based Spectrum Sensing Method
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Effects of Real Instrument on Performance of an Energy Detection-Based Spectrum Sensing Method

Capriglione, Domenico ; Cerro, Gianni ; Ferrigno, Luigi ; Miele, Gianfranco

IEEE transactions on instrumentation and measurement, 2019-05, Vol.68 (5), p.1302-1312 [Periódico revisado por pares]

New York: IEEE

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6
A Comprehensive Analysis of Error Sources in Electronic Fully Digital Impedance Bridges
A Comprehensive Analysis of Error Sources in Electronic Fully Digital Impedance Bridges
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A Comprehensive Analysis of Error Sources in Electronic Fully Digital Impedance Bridges

Ortolano, Massimo ; Marzano, Martina ; D'Elia, Vincenzo ; Mai Tran, Ngoc Thanh ; Rybski, Ryszard ; Kaczmarek, Janusz ; Koziol, Miroslaw ; Musiol, Krzysztof ; Christensen, Andreas Elmholdt ; Callegaro, Luca ; Kucera, Jan ; Power, Oliver

IEEE transactions on instrumentation and measurement, 2021, Vol.70, p.1-14 [Periódico revisado por pares]

New York: IEEE

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7
A Low-Cost On-Chip Built-In Self-Test Solution for ADC Linearity Test
A Low-Cost On-Chip Built-In Self-Test Solution for ADC Linearity Test
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A Low-Cost On-Chip Built-In Self-Test Solution for ADC Linearity Test

Chen, Tao ; Park, Chulhyun ; Meng, Hao ; Zhou, Dadian ; Silva-Martinez, Jose ; Geiger, Randall L. ; Chen, Degang

IEEE transactions on instrumentation and measurement, 2020-06, Vol.69 (6), p.3516-3526 [Periódico revisado por pares]

New York: IEEE

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8
An Improved Sine Wave Histogram Test Method for ADC Characterization
An Improved Sine Wave Histogram Test Method for ADC Characterization
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An Improved Sine Wave Histogram Test Method for ADC Characterization

Palfi, Vilmos

IEEE transactions on instrumentation and measurement, 2019-10, Vol.68 (10), p.3446-3455 [Periódico revisado por pares]

New York: IEEE

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9
High-Purity Sine Wave Generation Using Nonlinear DAC With Predistortion Based on Low-Cost Accurate DAC-ADC Co-Testing
High-Purity Sine Wave Generation Using Nonlinear DAC With Predistortion Based on Low-Cost Accurate DAC-ADC Co-Testing
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High-Purity Sine Wave Generation Using Nonlinear DAC With Predistortion Based on Low-Cost Accurate DAC-ADC Co-Testing

Zhuang, Yuming ; Magstadt, Benjamin ; Chen, Tao ; Chen, Degang

IEEE transactions on instrumentation and measurement, 2018-02, Vol.67 (2), p.279-287 [Periódico revisado por pares]

New York: IEEE

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10
The Core for High-Precision Stochastic Smart Grid Meter Based on Low-Resolution Flash ADC
The Core for High-Precision Stochastic Smart Grid Meter Based on Low-Resolution Flash ADC
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The Core for High-Precision Stochastic Smart Grid Meter Based on Low-Resolution Flash ADC

Urekar, Marjan ; Gazivoda, Nemanja ; Pejic, Abhilash

IEEE transactions on instrumentation and measurement, 2019-06, Vol.68 (6), p.1705-1713 [Periódico revisado por pares]

New York: IEEE

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