Result Number | Material Type | Add to My Shelf Action | Record Details and Options |
---|---|---|---|
1 |
Material Type: Artigo
|
[0 1 0] dislocations in the complex metallic alloy ξ ′-Al–Pd–MnFeuerbacher, M ; Caillard, DActa materialia, 2004-03, Vol.52 (5), p.1297-1304 [Periódico revisado por pares]Oxford: Elsevier LtdTexto completo disponível |
|
2 |
Material Type: Artigo
|
(001) Bi2Sr2Ca2Cu3O10 Superconducting Thin Films on Substrates with Large Film−Substrate Lattice Mismatch and Different Film−Substrate Lattice Mismatch AnisotropyEndo, K ; Badica, PCrystal growth & design, 2009-01, Vol.9 (1), p.391-394 [Periódico revisado por pares]Washington,DC: American Chemical SocietyTexto completo disponível |
|
3 |
Material Type: Artigo
|
{001} faults in B2 Fe-40 at.% Al-0.7 at.% C-0.5 at.% BPang, L. ; Chisholm, M.F. ; Kumar, K.S.Philosophical magazine letters, 1998-11, Vol.78 (5), p.349-355 [Periódico revisado por pares]London: Taylor & Francis GroupTexto completo disponível |
|
4 |
Material Type: Artigo
|
0.10 μm TiSi2 technology utilizing nitrogen diffusion controlled RTAMATSUBARA, Y ; SAKAI, T ; ISHIGAMI, T ; ANDO, K ; HORIUCHI, TThin solid films, 1995-12, Vol.270 (1-2), p.537-543 [Periódico revisado por pares]Lausanne: Elsevier ScienceTexto completo disponível |
|
5 |
Material Type: Ata de Congresso
|
0.12 micron logic process using a 248 nm step-and-scan systemBAKER, Dan ; ZHENG, Tammy ; TAKEMOTO, Cliff ; SETHI, Satyendra ; GABRIEL, Calvin ; SCOTT, GregSPIE proceedings series, 2000, p.294-304Bellingham WA: SPIETexto completo disponível |
|
6 |
Material Type: Ata de Congresso
|
0.15 μm gate length MHEMT technology for 77GHz automotive radar applicationsJIN HEE LEE ; HYUNG SUP YOON ; JAE YEOB SHIM ; JU YEON HONG ; DONG MIN KANG ; HAE CHEON KIM ; KYUNG IK CHO ; KYUNG HO LEE ; BOO WOO KIMPiscataway NJ: IEEE 2004Texto completo disponível |
|
7 |
Material Type: Ata de Congresso
|
0.18-μm optical lithography performances using an alternating DUV phase-shift maskTrouiller, Yorick ; Buffet, N ; Mourier, Thierry ; Schiavone, Patrick ; Quere, YvesSPIE proceedings series, 1998, Vol.3334, p.25-35Bellingham WA: SPIETexto completo disponível |
|
8 |
Material Type: Artigo
|
0.3–3 GHz magneto-dielectric properties of nanostructured NiZnCo ferrite from hydrothermal processShen, Xiang ; Wang, Yanxin ; Yang, Xiang ; Lu, Liqiang ; Huang, LiangJournal of materials science. Materials in electronics, 2010-06, Vol.21 (6), p.630-634 [Periódico revisado por pares]Boston: Springer USTexto completo disponível |
|
9 |
Material Type: Ata de Congresso
|
0.30k1 CH delineation with novel image reversal materialsHatakeyama, J ; Katayama, K ; Yoshihara, T ; Kawai, Y ; Ishihara, TProceedings of SPIE, the International Society for Optical Engineering, 2009, Vol.7273, p.72730L-72730L-9Bellingham, Wash: SPIETexto completo disponível |
|
10 |
Material Type: Ata de Congresso
|
0.31k1 ArF lithography for 70nm DRAMBOK, Cheolkyu ; LEE, Ki-Lyoung ; KIM, Jin-Woong ; PARK, Jun-Taek ; HWANG, Young-Sun ; EOM, Tae-Seung ; KIM, Seo-Min ; LEE, Geunsu ; JUNG, Jae-Chang ; LIM, Chang-Moon ; MOON, Seung-ChanSPIE proceedings series, 2005Bellingham WA: SPIETexto completo disponível |