Result Number | Material Type | Add to My Shelf Action | Record Details and Options |
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1 |
Material Type: Ata de Congresso
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0–1 Laws for Fragments of Existential Second-Order Logic: A SurveyKolaitis, Phokion G. ; Vardi, Moshe Y. Nielsen, Mogens ; Rovan, BranislavLecture notes in computer science, 2000, p.84-98 [Periódico revisado por pares]Berlin, Heidelberg: Springer Berlin HeidelbergTexto completo disponível |
2 |
Material Type: Ata de Congresso
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0.1-μm high-aspect-ratio pattern replication and linewidth controlChen, Zheng ; Vladimirsky, Yuli ; Cerrina, Franco ; Lai, Barry P ; Yun, Wenbing ; Gluskin, Efim SSPIE proceedings series, 1998, Vol.3331, p.591-600Bellingham WA: SPIETexto completo disponível |
3 |
Material Type: Ata de Congresso
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0.1 μm InGaAs/InAlAs/InP HEMT MMICs: a flight qualified technologyCHOU, Y. C ; LEUNG, D ; LAI, R ; GRUNDBACHER, R ; BARSKY, M ; KAN, Q ; TSAI, RTechnical digest - IEEE Gallium Arsenide Integrated Circuit Symposium, 2002, p.77-80Piscataway NJ: IEEETexto completo disponível |
4 |
Material Type: Ata de Congresso
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0.1 μm RFCMOS on high resistivity substrates for system on chip (SOC) applicationsYANG, J.-Y ; BENAISSA, K ; ASHBURN, S ; MADHANI, P ; BLYTHE, T ; SHICHIJO, H ; CRENSHAW, D ; WILLIAMS, B ; SRIDHAR, S ; AI, J ; BOSELLI, G ; ZHAO, S ; TANG, S.-P ; MAHALINGAM, NPiscataway NJ: IEEE 2002Texto completo disponível |
5 |
Material Type: Ata de Congresso
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0.11-μm imaging in KrF lithography using dipole illuminationEurlings, Mark ; van Setten, Eelco ; Torres, Juan Andres ; Dusa, Mircea V ; Socha, Robert J ; Capodieci, Luigi ; Finders, JoSPIE proceedings series, 2001, Vol.4404, p.266-278Bellingham WA: SPIETexto completo disponível |
6 |
Material Type: Ata de Congresso
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0.12 micron logic process using a 248 nm step-and-scan systemBAKER, Dan ; ZHENG, Tammy ; TAKEMOTO, Cliff ; SETHI, Satyendra ; GABRIEL, Calvin ; SCOTT, GregSPIE proceedings series, 2000, p.294-304Bellingham WA: SPIETexto completo disponível |
7 |
Material Type: Ata de Congresso
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A 0–1 quadratic knapsack problem for modelizing and solving the constraint satisfaction problemsEttaouil, Mohamed Cardoso, Amilcar ; Coasta, ErnestoLecture notes in computer science, 2005, p.61-72 [Periódico revisado por pares]Berlin, Heidelberg: Springer Berlin HeidelbergTexto completo disponível |
8 |
Material Type: Ata de Congresso
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A 0.013 mm2, 5 μW, DC-Coupled Neural Signal Acquisition IC With 0.5 V SupplyMULLER, Rikky ; GAMBINI, Simone ; RABAEY, Jan MIEEE journal of solid-state circuits, 2012, Vol.47 (1), p.232-243 [Periódico revisado por pares]New York, NY: Institute of Electrical and Electronics EngineersTexto completo disponível |
9 |
Material Type: Ata de Congresso
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A 0.016 mm2, 2.4 GHz RF Signal Quality Measurement Macro for RF Test and DiagnosisNOSE, Koichi ; MIZUNO, MasayukiIEEE journal of solid-state circuits, 2008, Vol.43 (4), p.1038-1046 [Periódico revisado por pares]New York, NY: Institute of Electrical and Electronics EngineersTexto completo disponível |
10 |
Material Type: Ata de Congresso
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A 0.08μm2-sized 8F2 Stack DRAM cell for multi-gigabit DRAMNOH, Hyunpil ; JEONG, Suock ; SHIN, Kisoo ; LEE, Sangdon ; LEE, Seongjoon ; KIM, Yousung ; CHO, Woncheol ; HUH, Min ; JEONG, Gucheol ; SUH, Jaebuhm ; KWEON, Hoyeop ; ROH, JaesungPiscataway NJ: IEEE 2002Texto completo disponível |