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Rough surface characterization using off-axis digital holographic microscopy compensated with self-hologram rotation
Rough surface characterization using off-axis digital holographic microscopy compensated with self-hologram rotation
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Rough surface characterization using off-axis digital holographic microscopy compensated with self-hologram rotation

Abdelsalam Ibrahim, Dahi Ghareab

Current Applied Physics, 2018, 18(11), , pp.1261-1267 [Periódico revisado por pares]

Elsevier B.V

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  • Realização: ABCD-USP USP   Logos de Redes Sociais: Freepik

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