Result Number | Material Type | Add to My Shelf Action | Record Details and Options |
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1 |
Material Type: Artigo
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Survey on Fault-Tolerant Techniques for Power Electronic ConvertersZhang, Wenping ; Xu, Dehong ; Enjeti, Prasad N. ; Li, Haijin ; Hawke, Joshua T. ; Krishnamoorthy, Harish S.IEEE transactions on power electronics, 2014-12, Vol.29 (12), p.6319-6331 [Periódico revisado por pares]New York: IEEETexto completo disponível |
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2 |
Material Type: Artigo
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Survey on Fault Operation on Multilevel InvertersLezana, Pablo ; Pou, Josep ; Meynard, Thierry A. ; Rodriguez, Jose ; Ceballos, Salvador ; Richardeau, FrédéricIEEE transactions on industrial electronics (1982), 2010-07, Vol.57 (7), p.2207-2218 [Periódico revisado por pares]New York: IEEETexto completo disponível |
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3 |
Material Type: Artigo
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Scalable Byzantine Consensus via Hardware-Assisted Secret SharingLiu, Jian ; Li, Wenting ; Karame, Ghassan O. ; Asokan, N.IEEE transactions on computers, 2019-01, Vol.68 (1), p.139-151 [Periódico revisado por pares]New York: IEEETexto completo disponível |
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4 |
Material Type: Artigo
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Analyzing and Increasing the Reliability of Convolutional Neural Networks on GPUsSantos, Fernando Fernandes dos ; Pimenta, Pedro Foletto ; Lunardi, Caio ; Draghetti, Lucas ; Carro, Luigi ; Kaeli, David ; Rech, PaoloIEEE transactions on reliability, 2019-06, Vol.68 (2), p.663-677 [Periódico revisado por pares]New York: IEEETexto completo disponível |
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5 |
Material Type: Artigo
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Efficient Byzantine Fault-ToleranceVeronese, G. S. ; Correia, M. ; Bessani, A. N. ; Lau Cheuk Lung ; Verissimo, P.IEEE transactions on computers, 2013-01, Vol.62 (1), p.16-30 [Periódico revisado por pares]New York: IEEETexto completo disponível |
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6 |
Material Type: Artigo
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CRAFT: Criticality-Aware Fault-Tolerance Enhancement Techniques for Emerging Memories-Based Deep Neural NetworksNguyen, Thai-Hoang ; Imran, Muhammad ; Choi, Jaehyuk ; Yang, Joon-SungIEEE transactions on computer-aided design of integrated circuits and systems, 2023-10, Vol.42 (10), p.1-1 [Periódico revisado por pares]New York: IEEETexto completo disponível |
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7 |
Material Type: Artigo
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Fault-Tolerant Probabilistic Gradient-Descent Bit Flipping DecoderAl Rasheed, Omran ; Ivanis, Predrag ; Vasic, BaneIEEE communications letters, 2014-09, Vol.18 (9), p.1487-1490 [Periódico revisado por pares]New York: IEEETexto completo disponível |
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8 |
Material Type: Artigo
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Postfault Full Torque-Speed Exploitation of Dual Three-Phase IPMSM DrivesEldeeb, Hisham M. ; Abdel-Khalik, Ayman S. ; Hackl, Christoph MichaelIEEE transactions on industrial electronics (1982), 2019-09, Vol.66 (9), p.6746-6756 [Periódico revisado por pares]New York: IEEETexto completo disponível |
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9 |
Material Type: Ata de Congresso
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FT-ClipAct: Resilience Analysis of Deep Neural Networks and Improving their Fault Tolerance using Clipped ActivationHoang, Le-Ha ; Hanif, Muhammad Abdullah ; Shafique, Muhammad2020 Design, Automation & Test in Europe Conference & Exhibition (DATE), 2020, p.1241-1246EDAATexto completo disponível |
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10 |
Material Type: Artigo
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Low-Cost Online Convolution Checksum CheckerFilippas, Dionysios ; Margomenos, Nikolaos ; Mitianoudis, Nikolaos ; Nicopoulos, Chrysostomos ; Dimitrakopoulos, GiorgosIEEE transactions on very large scale integration (VLSI) systems, 2022-02, Vol.30 (2), p.201-212 [Periódico revisado por pares]New York: IEEETexto completo disponível |