Result Number | Material Type | Add to My Shelf Action | Record Details and Options |
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1 |
Material Type: Artigo
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A Coupled Algorithmic-Heuristic Approach for Design OptimizationAzarm, Shapour ; Pecht, MichaelIEEE transactions on systems, man, and cybernetics, 1987-03, Vol.17 (2), p.289-293New York, NY: IEEETexto completo disponível |
2 |
Material Type: Artigo
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An Investigation into PWB Component-Placement TradeoffsPecht, Michael ; Palmer, Milton ; Schenke, Wolfgang ; Porter, RichardIEEE transactions on reliability, 1987-12, Vol.R-36 (5), p.524-527 [Periódico revisado por pares]New York, NY: IEEETexto completo disponível |
3 |
Material Type: Artigo
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CALCE/RAMCAD for ElectronicsPecht, MichaelIEEE transactions on reliability, 1987-12, Vol.R-36 (5), p.501-506 [Periódico revisado por pares]IEEETexto completo disponível |
4 |
Material Type: Artigo
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A critique of Mil-Hdbk-217E reliability prediction methodsPecht, M. ; Wen-Chang KangIEEE transactions on reliability, 1988-12, Vol.37 (5), p.453-457 [Periódico revisado por pares]New York, NY: IEEETexto completo disponível |
5 |
Material Type: Artigo
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Component-placement optimization for convectively cooled electronicsDancer, D. ; Pecht, M.IEEE transactions on reliability, 1989-06, Vol.38 (2), p.199-205 [Periódico revisado por pares]IEEETexto completo disponível |
6 |
Material Type: Artigo
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Placement for reliability and routability of convectively cooled PWBsOsterman, M.D. ; Pecht, M.IEEE transactions on computer-aided design of integrated circuits and systems, 1990-07, Vol.9 (7), p.734-744 [Periódico revisado por pares]New York, NY: IEEETexto completo disponível |
7 |
Material Type: Ata de Congresso
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PWB solder joint life calculations under thermal and vibrational loadingBarker, D.B. ; Dasgupta, A. ; Pecht, M.G.Annual Reliability and Maintainability Symposium. 1991 Proceedings, 1991, p.451-459IEEETexto completo disponível |
8 |
Material Type: Ata de Congresso
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Improved techniques for cost effective electronicsLeonard, C.T. ; Pecht, M.G.Annual Reliability and Maintainability Symposium. 1991 Proceedings, 1991, p.174-182IEEETexto completo disponível |
9 |
Material Type: Ata de Congresso
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Advances in the reliable design of electronicsPecht, M.1991 Proceedings, Seventh IEEE Semiconductor Thermal Measurement and Management Symposium, 1991, p.52IEEETexto completo disponível |
10 |
Material Type: Artigo
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Material failure mechanisms and damage modelsDasgupta, A. ; Pecht, M.IEEE transactions on reliability, 1991-12, Vol.40 (5), p.531-536 [Periódico revisado por pares]New York, NY: IEEETexto completo disponível |