Result Number | Material Type | Add to My Shelf Action | Record Details and Options |
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1 |
Material Type: Artigo
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Automated Synthesis of Data Paths in Digital SystemsChia-Jeng Tseng ; Siewiorek, D.P.IEEE transactions on computer-aided design of integrated circuits and systems, 1986-07, Vol.5 (3), p.379-395 [Periódico revisado por pares]New York, NY: IEEETexto completo disponível |
2 |
Material Type: Ata de Congresso
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Exchange power management for mobile ad hoc networksDorsey, J. ; Siewiorek, D.Proceedings IEEE 24th Annual Joint Conference of the IEEE Computer and Communications Societies, 2005, Vol.1, p.90-101 vol. 1IEEETexto completo disponível |
3 |
Material Type: Artigo
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Fault tolerance in commercial computersSiewiorek, D.P.Computer (Long Beach, Calif.), 1990-07, Vol.23 (7), p.26-37 [Periódico revisado por pares]IEEETexto completo disponível |
4 |
Material Type: Artigo
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A survey of highly parallel computingHaynes, L S ; Lau, R L ; Siewiorek, D P ; Mizell, D WComputer (Long Beach, Calif.), 1982-01, Vol.15 (1), p.9-24 [Periódico revisado por pares]IEEETexto completo disponível |
5 |
Material Type: Ata de Congresso
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Automated robustness testing of off-the-shelf software componentsKropp, N.P. ; Koopman, P.J. ; Siewiorek, D.P.Digest of Papers. Twenty-Eighth Annual International Symposium on Fault-Tolerant Computing (Cat. No.98CB36224), 1998, p.230-239IEEETexto completo disponível |
6 |
Material Type: Ata de Congresso
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IFSys: an integrated framework for system-level synthesisDeang, J. ; McNally, G. ; Siewiorek, D.Proceedings IEEE Computer Society Workshop on VLSI'98 System Level Design (Cat. No.98EX158), 1998, p.5-10IEEETexto completo disponível |
7 |
Material Type: Artigo
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The EDRC and design: a deeper understandingSiewiorek, D.P. ; Fenves, S.J. ; Demes, G.H.IEEE expert, 1997-07, Vol.12 (4), p.83-84IEEETexto completo disponível |
8 |
Material Type: Ata de Congresso
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Application transparent fault management in fault tolerant MachRussinovich, M. ; Segall, Z. ; Siewiorek, D.P.FTCS-23 The Twenty-Third International Symposium on Fault-Tolerant Computing, 1993, p.10-19IEEETexto completo disponível |
9 |
Material Type: Ata de Congresso
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A dimensionality model approach to testing and improving software robustnessPan, J. ; Koopman, P. ; Siewiorek, D.1999 IEEE AUTOTESTCON Proceedings (Cat. No.99CH36323), 1999, p.493-501IEEETexto completo disponível |
10 |
Material Type: Artigo
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The engineering design research center of Carnegie Mellon UniversityDemes, G.H. ; Westerberg, A.W. ; Fenves, S.J. ; Grossmann, I.E. ; Hendrickson, C.T. ; Mitchell, T.M. ; Prinz, F.B. ; Siewiorek, D.P. ; Subrahmanian, E. ; Talukdar, S.Proceedings of the IEEE, 1993-01, Vol.81 (1), p.10-24 [Periódico revisado por pares]New York, NY: IEEETexto completo disponível |