Result Number | Material Type | Add to My Shelf Action | Record Details and Options |
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1 |
Material Type: Artigo
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ISFET fabrication and characterization for hydrogen peroxide sensingPedro Henrique Duarte Ricardo Cardoso Rangel; Daniel Augusto Ramos; Leonardo Shimizu Yojo; Carlos Augusto Bergfeld Mori; Katia Regina Akemi Sasaki; Paula Ghedini Der Agopian; João Antonio Martino 1959-Journal of Integrated Circuits and Systems Porto Alegre v. 18, n. 1, p. 1-4, 2023Porto Alegre 2023Item não circula. Consulte sua biblioteca.(Acessar) |
2 |
Material Type: Artigo
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Nanowire Tunnel Field Effect Transistors at High TemperatureMárcio Dalla Valle Martino Felipe Souza Neves; Paula Ghedini Der Agopian; João Antonio Martino 1959-; Rita Rooyackers; Cor ClaeysJournal of Integrated Circuits and Systems v.8, n.2, p. 110-115, 20132013Acesso online |
3 |
Material Type: Artigo
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Performance of source follower buffers implemented with standard and strained triple-gate nFinFETsMarcelo Antonio Pavanello João Antonio Martino 1959-; Eddy Simoen; Cor Claeys; Rita Rooyackers; Nadine CollaertJournal of Integrated Circuits and Systems v.5, n.2, p. 168-173, 2010Porto Alegre 2010Item não circula. Consulte sua biblioteca.(Acessar) |
4 |
Material Type: Artigo
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Performance of source follower buffers implemented with standard and strained triple-gate nFinFETsMarcelo Antonio Pavanello João Antonio Martino 1959-; Eddy Simoen; Cor Claeys; Rita Rooyackers; Nadine CollaertJournal of Integrated Circuits and Systems v.5, n.2, p. 168-173, 2010Porto Alegre 2010Item não circula. Consulte sua biblioteca.(Acessar) |
5 |
Material Type: Artigo
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Low-dropout voltage regulator designed with nanowire TFET with different source composition experimental dataRodrigo do Nascimento Toledo João Antonio Martino 1959-; Paula Ghedini Der AgopianJournal of Integrated Circuits and Systems Porto Alegre v.18, n.1, p. 1-6, 2023Porto Alegre 2023Item não circula. Consulte sua biblioteca.(Acessar) |
6 |
Material Type: Artigo
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Total ionizing dose influence on proton irradiated triple gate SOI tunnel FETsTorres, H.L.F ; Martino, J.A ; Rooyackers, R ; Simoen, E ; Claeys, C ; Agopian, P.G.DJournal of Integrated Circuits and Systems, 2018-10, Vol.13 (2)Texto completo disponível |