Result Number | Material Type | Add to My Shelf Action | Record Details and Options |
---|---|---|---|
1 |
Material Type: Standard
|
Proposed Test Code for Direct-Current Carbon-Pile Voltage Regulators for AircraftAIEE Std No. 802, 1955, p.1IEEETexto completo disponível |
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2 |
Material Type: Standard
|
Proposed Test Code for Direct-Current Carbon-Pile Voltage Regulators for AircraftAIEE Std No. 802, 1955, p.1IEEETexto completo disponível |
|
3 |
Material Type: Standard
|
American National Standard Graphic Symbols for Electrical Wiring and Layout Diagrams Used in Architecture and Building ConstructionANSI Std Y32.9-1972, 1972, p.0_1IEEETexto completo disponível |
|
4 |
Material Type: Standard
|
American National Standard Graphic Symbols for Electrical Wiring and Layout Diagrams Used in Architecture and Building ConstructionANSI Std Y32.9-1972, 1972, p.0_1IEEETexto completo disponível |
|
5 |
Material Type: Standard
|
IEEE Trial Use Standard for Microprocessor Universal Format for Object ModulesIEEE Std 695-1985, 1985, p.1-28IEEETexto completo disponível |
|
6 |
Material Type: Standard
|
IEEE Standard Backplane Bus Specifications for Multiprocessor Architectures: Futurebus+(R)ANSI/IEEE Std 896.1-1987, 1988, p.1-64IEEETexto completo disponível |
|
7 |
Material Type: Standard
|
IEEE Standard for Microprocessor Universal Format for Object ModulesIEEE Std 695-1990, 1990, p.1-0IEEETexto completo disponível |
|
8 |
Material Type: Standard
|
IEEE Standard for Microprocessor Universal Format for Object ModulesIEEE Std 695-1990, 1990, p.1-0IEEETexto completo disponível |
|
9 |
Material Type: Standard
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Local and Metropolitan Area Networks: IEEE Standard: Overview and ArchitectureIEEE Std 802-1990, 1990, p.1-32IEEETexto completo disponível |
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10 |
Material Type: Standard
|
IEEE Recommended Practice for Latchup Test Methods for CMOS and BiCMOS Integrated-Circuit Process CharacterizationIEEE Std 1181-1991, 1991, p.0_1IEEETexto completo disponível |