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Proposed Test Code for Direct-Current Carbon-Pile Voltage Regulators for Aircraft
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Standard
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Proposed Test Code for Direct-Current Carbon-Pile Voltage Regulators for Aircraft

AIEE Std No. 802, 1955, p.1

IEEE

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Proposed Test Code for Direct-Current Carbon-Pile Voltage Regulators for Aircraft
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Proposed Test Code for Direct-Current Carbon-Pile Voltage Regulators for Aircraft

AIEE Std No. 802, 1955, p.1

IEEE

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3
American National Standard Graphic Symbols for Electrical Wiring and Layout Diagrams Used in Architecture and Building Construction
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Standard
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American National Standard Graphic Symbols for Electrical Wiring and Layout Diagrams Used in Architecture and Building Construction

ANSI Std Y32.9-1972, 1972, p.0_1

IEEE

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4
American National Standard Graphic Symbols for Electrical Wiring and Layout Diagrams Used in Architecture and Building Construction
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American National Standard Graphic Symbols for Electrical Wiring and Layout Diagrams Used in Architecture and Building Construction

ANSI Std Y32.9-1972, 1972, p.0_1

IEEE

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5
IEEE Trial Use Standard for Microprocessor Universal Format for Object Modules
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IEEE Trial Use Standard for Microprocessor Universal Format for Object Modules

IEEE Std 695-1985, 1985, p.1-28

IEEE

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6
IEEE Standard Backplane Bus Specifications for Multiprocessor Architectures: Futurebus+(R)
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IEEE Standard Backplane Bus Specifications for Multiprocessor Architectures: Futurebus+(R)

ANSI/IEEE Std 896.1-1987, 1988, p.1-64

IEEE

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7
IEEE Standard for Microprocessor Universal Format for Object Modules
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IEEE Standard for Microprocessor Universal Format for Object Modules

IEEE Std 695-1990, 1990, p.1-0

IEEE

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8
IEEE Standard for Microprocessor Universal Format for Object Modules
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Standard
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IEEE Standard for Microprocessor Universal Format for Object Modules

IEEE Std 695-1990, 1990, p.1-0

IEEE

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9
Local and Metropolitan Area Networks: IEEE Standard: Overview and Architecture
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Standard
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Local and Metropolitan Area Networks: IEEE Standard: Overview and Architecture

IEEE Std 802-1990, 1990, p.1-32

IEEE

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10
IEEE Recommended Practice for Latchup Test Methods for CMOS and BiCMOS Integrated-Circuit Process Characterization
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IEEE Recommended Practice for Latchup Test Methods for CMOS and BiCMOS Integrated-Circuit Process Characterization

IEEE Std 1181-1991, 1991, p.0_1

IEEE

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