Result Number | Material Type | Add to My Shelf Action | Record Details and Options |
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1 |
Material Type: Artigo
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Computational damage mechanics of electromigration and thermomigrationYao, Wei ; Basaran, CemalJournal of applied physics, 2013-09, Vol.114 (10) [Periódico revisado por pares]Texto completo disponível |
2 |
Material Type: Artigo
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Effect of Cu and Ag solute segregation on β Sn grain boundary diffusivitySellers, Michael S. ; Schultz, Andrew J. ; Basaran, Cemal ; Kofke, David A.Journal of applied physics, 2011-07, Vol.110 (1), p.013528-013528-9 [Periódico revisado por pares]American Institute of PhysicsTexto completo disponível |
3 |
Material Type: Artigo
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Electromigration analysis of solder joints under ac load: A mean time to failure modelYao, Wei ; Basaran, CemalJournal of applied physics, 2012-03, Vol.111 (6), p.063703-063703-12 [Periódico revisado por pares]American Institute of PhysicsTexto completo disponível |
4 |
Material Type: Artigo
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Electromigration time to failure of SnAgCuNi solder jointsBasaran, Cemal ; Li, Shidong ; Hopkins, Douglas C. ; Veychard, DamienJournal of applied physics, 2009-07, Vol.106 (1), p.013707-013707-10 [Periódico revisado por pares]American Institute of PhysicsTexto completo disponível |
5 |
Material Type: Artigo
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Hot phonons contribution to Joule heating in single-walled carbon nanotubesGautreau, Pierre ; Ragab, Tarek ; Basaran, CemalJournal of applied physics, 2012-11, Vol.112 (10) [Periódico revisado por pares]Texto completo disponível |
6 |
Material Type: Artigo
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Joule heating in single-walled carbon nanotubesRagab, Tarek ; Basaran, CemalJournal of applied physics, 2009-09, Vol.106 (6), p.063705-063705-5 [Periódico revisado por pares]American Institute of PhysicsTexto completo disponível |
7 |
Material Type: Artigo
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Measuring Joule heating and strain induced by electrical current with Moiré interferometryChen, Bicheng ; Basaran, CemalJournal of applied physics, 2011-04, Vol.109 (7), p.074908-074908-7 [Periódico revisado por pares]United States: American Institute of PhysicsTexto completo disponível |
8 |
Material Type: Artigo
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Phonon dispersion and quantization tuning of strained carbon nanotubes for flexible electronicsGautreau, Pierre ; Ragab, Tarek ; Chu, Yanbiao ; Basaran, CemalJournal of applied physics, 2014-06, Vol.115 (24) [Periódico revisado por pares]Melville: American Institute of PhysicsTexto completo disponível |
9 |
Material Type: Artigo
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Publisher's Note: "Electromigration analysis of solder joints under ac load: A mean time to failure model" [ J. Appl. Phys. 111 , 063703 ( 2012 ) ]Yao, Wei ; Basaran, CemalJournal of applied physics, 2012-05, Vol.111 (9), p.099906-099906-1 [Periódico revisado por pares]American Institute of PhysicsTexto completo disponível |
10 |
Material Type: Artigo
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Thermomigration induced degradation in solder alloysBasaran, Cemal ; Li, Shidong ; Abdulhamid, Mohd F.Journal of applied physics, 2008-06, Vol.103 (12), p.123520-123520-9 [Periódico revisado por pares]American Institute of PhysicsTexto completo disponível |