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Sub-0.1 nm-resolution quantitative scanning transmission electron microscopy without adjustable parameters

Dwyer, C. ; Maunders, C. ; Zheng, C. L. ; Weyland, M. ; Tiemeijer, P. C. ; Etheridge, J.

Applied physics letters, 2012-05, Vol.100 (19) [Periódico revisado por pares]

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Título:
Sub-0.1 nm-resolution quantitative scanning transmission electron microscopy without adjustable parameters
Autor: Dwyer, C. ; Maunders, C. ; Zheng, C. L. ; Weyland, M. ; Tiemeijer, P. C. ; Etheridge, J.
Assuntos: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY ; NANOSCIENCE AND NANOTECHNOLOGY ; NANOSTRUCTURES ; RESOLUTION ; SCANNING ELECTRON MICROSCOPY ; TRANSMISSION ELECTRON MICROSCOPY
É parte de: Applied physics letters, 2012-05, Vol.100 (19)
Descrição: Atomic-resolution imaging in the scanning transmission electron microscope (STEM) constitutes a powerful tool for nanostructure characterization. Here, we demonstrate the quantitative interpretation of atomic-resolution high-angle annular dark-field (ADF) STEM images using an approach that does not rely on adjustable parameters. We measure independently the instrumental parameters that affect sub-0.1 nm-resolution ADF images, quantify their individual and collective contributions to the image intensity, and show that knowledge of these parameters enables a quantitative interpretation of the absolute intensity and contrast across all accessible spatial frequencies. The analysis also provides a method for the in-situ measurement of the STEM’s effective source distribution.
Editor: United States
Idioma: Inglês

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