Impact of the ferroelectric layer thickness on the resistive switching characteristics of ferroelectric/dielectric structures
Silva, J. M. B. ; Silva, J. P. B. ; Sekhar, K. C. ; Pereira, M. ; Gomes, M. J. M.
Applied physics letters, 2018-09, Vol.113 (10) [Periódico revisado por pares]Melville: American Institute of Physics
Texto completo disponível