A Review of Knowledge-Based Defect Identification via PRPD Patterns in High Voltage Apparatus

Shahsavarian, Tohid ; Pan, Yue ; Zhang, Zhousheng ; Pan, Cheng ; Naderiallaf, Hadi ; Guo, Jim ; Li, Chuanyang ; Cao, Yang

IEEE access, 2021, Vol.9, p.77705-77728 [Periódico revisado por pares]

Piscataway: IEEE

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