Annealing effects of In2O3 thin films on electrical properties and application in thin film transistors

Yuan, Zijian ; Zhu, Xiaming ; Wang, Xiong ; Cai, Xikun ; Zhang, Bingpo ; Qiu, Dongjiang ; Wu, Huizhen

Thin solid films, 2011-03, Vol.519 (10), p.3254-3258 [Periódico revisado por pares]

Amsterdam: Elsevier

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