Sample preserving deep interface characterization technique

Holmström, E ; Olovsson, W ; Abrikosov, I A ; Niklasson, A M N ; Johansson, B ; Gorgoi, M ; Karis, O ; Svensson, S ; Schäfers, F ; Braun, W ; Ohrwall, G ; Andersson, G ; Marcellini, M ; Eberhardt, W

Physical review letters, 2006-12, Vol.97 (26), p.266106-266106 [Periódico revisado por pares]

United States

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