Conduction mechanisms and low-frequency electrical noise studies in pin InGaAs/InAlAs strained MQW photodiodes

Pires, M.P. ; Guastavino, F.C. ; Yavich, B. ; Souza, P.L. ; Mwongbote, A.E. ; Valenza, M.

IEEE transactions on electron devices, 2005-09, Vol.52 (9), p.1949-1953 [Periódico revisado por pares]

New York, NY: IEEE

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