Smart-Redundancy With In Memory ECC Checking: Low-Power SEE-Resistant FPGA Architectures

Alacchi, Aurelien ; Giacomin, Edouard ; Gauchi, Roman ; Kulis, Szymon ; Gaillardon, Pierre-Emmanuel

IEEE transactions on very large scale integration (VLSI) systems, 2023-08, Vol.31 (8), p.1204-1213 [Periódico revisado por pares]

New York: IEEE

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