Modified Control Charts Monitoring Long-Term Semiconductor Manufacturing Processes
de Souza, Jorge M. ; de Holanda, Giovanni M. ; Henriques, Hingmar A. ; Furukawa, Rafael H. Saotome, Osamu ; Gomes de Oliveira, Gabriel ; Mendes de Seixas, Ana Claudia ; Iano, Yuzo ; Kemper, Guillermo
Proceedings of the 6th Brazilian Technology Symposium (BTSym’20), p.80-87 [Periódico revisado por pares]Cham: Springer International Publishing
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