Impact of Scan Rate and Mobile Ion Concentration on the Anomalous J-V Curves of Metal Halide Perovskite-based Memristors

Perez-Martinez, Jose Carlos ; Martin-Martin, Diego ; Del Pozo, Gonzalo ; Arredondo, Belen ; Guerrero, Antonio ; Romero, Beatriz

IEEE electron device letters, 2023-08, Vol.44 (8), p.1-1 [Periódico revisado por pares]

IEEE

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