Comparative Analysis of n- and p-type Ferroelectric Tunnel Junctions Through Understanding of non-FE Resistance Switching

Koo, Ryun-Han ; Shin, Wonjun ; Ryu, Sangwoo ; Lee, Kyungmin ; Park, Sung-Ho ; Im, Jiseong ; Ko, Jong-Hyun ; Kim, Jeong-Hyun ; Kwon, Dongseok ; Kim, Jae-Joon ; Kwon, Daewoong ; Lee, Jong-Ho

IEEE electron device letters, 2023-10, Vol.44 (10), p.1-1 [Periódico revisado por pares]

IEEE

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