Recent trends in CMOS reliability: from individual traps to circuit simulations
Kaczer, B ; Toledano-Luque, M ; Franco, J ; Grasser, T ; Roussel, Ph J ; Camargo, VVA ; Mahato, S ; Simoen, E ; Catthoor, F ; Wirth, GI ; Groeseneken, G
IEEE International Integrated Reliability Workshop Final Report (IRW), 2011, 2012Texto completo disponível