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Evaluation Scheme of Voltage Sag Immunity in Sensitive Industrial Process

Huang, Anjunguo ; Xiao, Xianyong ; Wang, Ying

IEEE access, 2021, Vol.9, p.66398-66407 [Periódico revisado por pares]

Piscataway: IEEE

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  • Título:
    Evaluation Scheme of Voltage Sag Immunity in Sensitive Industrial Process
  • Autor: Huang, Anjunguo ; Xiao, Xianyong ; Wang, Ying
  • Assuntos: Assembly lines ; Deviation ; Economic impact ; Economic models ; Evaluation ; Immunity ; Logistics ; Loss measurement ; minimal cut set ; Paper mills ; Power lines ; Power quality ; Process control ; process immunity time ; Production ; Variable speed drives ; Voltage sag ; Voltage sags ; voltage tolerance curve
  • É parte de: IEEE access, 2021, Vol.9, p.66398-66407
  • Descrição: In order to enhance the effectiveness of voltage sag governance and the practicability of the process immunity assessment method, an immunity assessment method for the assembly line process is proposed, fully considering the relationship between logistics line and power line, and thoroughly portraying the relationship between equipment and its links in depth. Combined with the existing voltage tolerance curve test results, the power line immunity time is reasonably evaluated considering the response delay of each device. In addition, the fault probability is quantified considering the possibility of equipment failure and its link repairing. On this basis, the minimal cut-set method is adapted to standardize the constructed random network of logistics lines. The immunity of the whole manufacturing process is evaluated through series-parallel logical analysis. In the end, the paper mill is taken as a sample to illustrate the proposed method. The deviation between the average annual economic loss obtained from model evaluation and this typical producer's survey loss is regarded as the basis for the measurement of the effectiveness of the method. The results show that the immunity of the process can be accurately evaluated for the deviation of the evaluation obtained by the proposed method is relatively small.
  • Editor: Piscataway: IEEE
  • Idioma: Inglês
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  • Realização: ABCD-USP USP   Logos de Redes Sociais: Freepik

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