Fourth-generation epac-based FRET sensors for cAMP feature exceptional brightness, photostability and dynamic range: characterization of dedicated sensors for FLIM, for ratiometry and with high affinity

Klarenbeek, Jeffrey ; Goedhart, Joachim ; van Batenburg, Aernoud ; Groenewald, Daniella ; Jalink, Kees Anderson, Kurt I.

PloS one, 2015-04, Vol.10 (4), p.e0122513-e0122513 [Periódico revisado por pares]

United States: Public Library of Science

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