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Stability, resolution, and ultra-low wear amplitude modulation atomic force microscopy of DNA: Small amplitude small set-point imaging

Santos, Sergio ; Barcons, Victor ; Christenson, Hugo K. ; Billingsley, Daniel J. ; Bonass, William A. ; Font, Josep ; Thomson, Neil H.

Applied physics letters, 2013-08, Vol.103 (6) [Periódico revisado por pares]

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Título:
Stability, resolution, and ultra-low wear amplitude modulation atomic force microscopy of DNA: Small amplitude small set-point imaging
Autor: Santos, Sergio ; Barcons, Victor ; Christenson, Hugo K. ; Billingsley, Daniel J. ; Bonass, William A. ; Font, Josep ; Thomson, Neil H.
Assuntos: Amplitude modulation Atomic force microscopy ; Atomic force microscopy ; Biologia molecular ; Biotecnologia ; Enginyeria electrònica ; Enginyeria química ; Microscòpia de força atòmica ; Modulació (Electrònica) ; Modulation (Electronics) ; Molecular biology ; Àrees temàtiques de la UPC
É parte de: Applied physics letters, 2013-08, Vol.103 (6)
Descrição: A way to operate fundamental mode amplitude modulation atomic force microscopy is introduced which optimizes stability and resolution for a given tip size and shows negligible tip wear over extended time periods (∼24 h). In small amplitude small set-point (SASS) imaging, the cantilever oscillates with sub-nanometer amplitudes in the proximity of the sample, without the requirement of using large drive forces, as the dynamics smoothly lead the tip to the surface through the water layer. SASS is demonstrated on single molecules of double-stranded DNA in ambient conditions where sharp silicon tips (R ∼ 2–5 nm) can resolve the right-handed double helix.
Idioma: Inglês

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