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Application of Magnetic Force Microscopy for Investigation of Epitaxial Ferro- and Antiferromagnetic Structures

Mikhailov, Gennady M ; Chernykh, Anatoliy V ; Fomin, Lev A

Materials, 2017-10, Vol.10 (10), p.1156 [Periódico revisado por pares]

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Título:
Application of Magnetic Force Microscopy for Investigation of Epitaxial Ferro- and Antiferromagnetic Structures
Autor: Mikhailov, Gennady M ; Chernykh, Anatoliy V ; Fomin, Lev A
Assuntos: Anisotropy ; Antiferromagnetism ; Atomic force microscopy ; Crystallography ; Epitaxial growth ; epitaxial microstructures ; exchange bias ; Exchanging ; FeMn ; Ferromagnetism ; Iron ; Magnetic fields ; Magnetic force microscopy ; Magnetism ; Microscopy ; Sapphire
É parte de: Materials, 2017-10, Vol.10 (10), p.1156
Notas: ObjectType-Article-1
SourceType-Scholarly Journals-1
ObjectType-Feature-2
content type line 23
Descrição: Growing of epitaxial Fe Mn /Fe/Mo/R-sapphire films was performed with a new configuration of two in-plane easy axes of Fe(001)-layer magnetization in which application of annealing in a magnetic field forms an unidirectional anisotropy. The microstructures made from these films exhibited an exchange bias 25-35 G along an exchange field generated at antiferromagnet/ferromagnet (AFM/FM) interface. Magnetic force microscopy (MFM) experiments supported by micromagnetic calculations and magneto-resistive measurements allowed interpretation of the magnetic states of the Fe layer in these microstructures. The magnetic states of the iron layer are influenced more by crystallographic anisotropy of the Fe-layer than by unidirectional exchange anisotropy.
Editor: Switzerland: MDPI AG
Idioma: Inglês

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