Measurement of silicon particles by laser surface scanning and angle-resolved light scattering

HUFF, H. R ; GOODALL, R. K ; STOVER, J ; WILLIAMS, E ; WOO, K.-S ; LIU, B. Y. H ; WARNER, T ; HIRLEMAN, D ; GILDERSLEEVE, K ; BULLIS, W. M ; SCHEER, B. W

Journal of the Electrochemical Society, 2019-12, Vol.144 (1), p.243-250 [Periódico revisado por pares]

Pennington, NJ: Electrochemical Society

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