The utility of resonant soft x-ray scattering and reflectivity for the nanoscale characterization of polymers

Swaraj, S. ; Wang, C. ; Araki, T. ; Mitchell, G. ; Liu, L. ; Gaynor, S. ; Deshmukh, B. ; Yan, H. ; McNeill, C. R. ; Ade, H.

The European physical journal. ST, Special topics, 2009-02, Vol.167 (1), p.121-126 [Periódico revisado por pares]

Berlin/Heidelberg: Springer-Verlag

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