Critical analysis of ion detection using semiconductor field effect devices consequences for chemical and biomedical applications
R. A. S. Nascimento Marcelo Mulato; Electrochemical Society Meeting (ECS) (219. 2011 Montreal)
Abstracts Montreal, 2011Montreal 2011
Localização: FFCLRP - Fac. Fil. Ciên. Let. de R. Preto (pcd 2253172 Estantes Deslizantes ) e outros locais(Acessar)
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pcd 2253563 estantes deslizantes
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