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Identifying patch correctness in test-based program repair

Xiong, Yingfei ; Liu, Xinyuan ; Zeng, Muhan ; Zhang, Lu ; Huang, Gang

2018 IEEE/ACM 40th International Conference on Software Engineering (ICSE), 2018, p.789-799

New York, NY, USA: ACM

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Título:
Identifying patch correctness in test-based program repair
Autor: Xiong, Yingfei ; Liu, Xinyuan ; Zeng, Muhan ; Zhang, Lu ; Huang, Gang
Assuntos: Computer crashes ; Maintenance engineering ; Null value ; patch classification ; patch correctness ; Runtime ; Search problems ; Software ; Software and its engineering ; Software and its engineering -- Software creation and management ; Software and its engineering -- Software creation and management -- Software verification and validation ; Software and its engineering -- Software creation and management -- Software verification and validation -- Software defect analysis ; Software and its engineering -- Software creation and management -- Software verification and validation -- Software defect analysis -- Software testing and debugging ; Software and its engineering -- Software organization and properties ; Software and its engineering -- Software organization and properties -- Software functional properties ; Test based program repair ; test generation ; Theory of computation ; Theory of computation -- Semantics and reasoning ; Theory of computation -- Semantics and reasoning -- Program reasoning ; Theory of computation -- Semantics and reasoning -- Program reasoning -- Program verification
É parte de: 2018 IEEE/ACM 40th International Conference on Software Engineering (ICSE), 2018, p.789-799
Descrição: Test-based automatic program repair has attracted a lot of attention in recent years. However, the test suites in practice are often too weak to guarantee correctness and existing approaches often generate a large number of incorrect patches. To reduce the number of incorrect patches generated, we propose a novel approach that heuristically determines the correctness of the generated patches. The core idea is to exploit the behavior similarity of test case executions. The passing tests on original and patched programs are likely to behave similarly while the failing tests on original and patched programs are likely to behave differently. Also, if two tests exhibit similar runtime behavior, the two tests are likely to have the same test results. Based on these observations, we generate new test inputs to enhance the test suites and use their behavior similarity to determine patch correctness. Our approach is evaluated on a dataset consisting of 139 patches generated from existing program repair systems including jGen-Prog, Nopol, jKali, ACS and HDRepair. Our approach successfully prevented 56.3% of the incorrect patches to be generated, without blocking any correct patches.
Editor: New York, NY, USA: ACM
Idioma: Inglês

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Identifying patch correctness in test-based program repair

Xiong, Yingfei ; Liu, Xinyuan ; Zeng, Muhan ; Zhang, Lu ; Huang, Gang

New York, NY, USA: ACM

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