Investigation of Gate-Length Scaling of Ferroelectric FET
Jindal, Sourabh ; Manhas, Sanjeev Kumar ; Gautam, Satendra Kumar ; Balatti, Simone ; Kumar, Arvind ; Pakala, Mahendra
IEEE transactions on electron devices, 2021-03, Vol.68 (3), p.1364-1368 [Periódico revisado por pares]New York: IEEE
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