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Radially polarized light for detection and nanolocalization of dielectric particles on a planar substrate

Roy, S ; Ushakova, K ; van den Berg, Q ; Pereira, S F ; Urbach, H P

Physical review letters, 2015-03, Vol.114 (10), p.103903-103903, Article 103903 [Periódico revisado por pares]

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Título:
Radially polarized light for detection and nanolocalization of dielectric particles on a planar substrate
Autor: Roy, S ; Ushakova, K ; van den Berg, Q ; Pereira, S F ; Urbach, H P
Assuntos: Approximation ; Dielectrics ; Far fields ; Localization ; Nanoparticles ; Nanostructure ; Polarized light ; Pupils
É parte de: Physical review letters, 2015-03, Vol.114 (10), p.103903-103903, Article 103903
Notas: ObjectType-Article-1
SourceType-Scholarly Journals-1
ObjectType-Feature-2
content type line 23
Descrição: A fast noninvasive method based on scattering from a focused radially polarized light to detect and localize subwavelength nanoparticles on a substrate is presented. The technique relies on polarization matching in the far field between scattered and spurious reflected fields. Results show a localization uncertainty of ≈10^{-4}λ^{2} is possible for a particle of area ≈λ^{2}/16. The effect of simple pupil shaping is also shown.
Editor: United States
Idioma: Inglês

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