Electronic structure of hydrogenated amorphous Si1―xNx thin films using soft X-ray emission and absorption measurements

BOYKO, Teak ; KASAP, Safa ; JOHANSON, Robert ; KOBAYASHI, S ; AOKI, T ; MOEWES, Alexander

Physica status solidi. A, Applications and materials science (Print), 2009, Vol.206 (5), p.935-939 [Periódico revisado por pares]

Berlin: Wiley-VCH

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