Idioma:

Papers presented at the International Conference on Extended Defects in Semiconductors (EDS 2008) : Poitiers-Futurscope, France, 14-19 September 2008

International Conference on Extended Defects in Semiconductors (2008 : Poitiers-Futurscope, France) Eric Le Bourhis; Jacques Rabier

Disponible en IF - Instituto de Física (MS PHSSC v.6 n.8 )(Obténgalo)

Título:
Papers presented at the International Conference on Extended Defects in Semiconductors (EDS 2008) : Poitiers-Futurscope, France, 14-19 September 2008
Autor: International Conference on Extended Defects in Semiconductors (2008 : Poitiers-Futurscope, France)
Eric Le Bourhis; Jacques Rabier
Materias: Semiconductors -- Defects -- Congresses; SEMICONDUTORES (CONGRESSOS)
Notas: Includes bibliographical references.
Títulos relacionados: Serie:Physica status solidi. C ; v.6, no. 8.
Editor: Weinheim : Wiley-VCH
Fecha de creación: c2009
Formato: p. 1794-1991 : ill. ; 28 cm..
Idioma: Inglés

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