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Preliminary Overview of the Extreme Condition Beamline (EMA) at the new Brazilian Synchrotron Source (Sirius)

dos Reis, R D ; Kaneko, U F ; Francisco, B A ; Fonseca Jr, J ; Eleoterio, M A S ; Souza-Neto, N M

Journal of physics. Conference series, 2020-08, Vol.1609 (1), p.12015 [Periódico revisado por pares]

Bristol: IOP Publishing

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  • Título:
    Preliminary Overview of the Extreme Condition Beamline (EMA) at the new Brazilian Synchrotron Source (Sirius)
  • Autor: dos Reis, R D ; Kaneko, U F ; Francisco, B A ; Fonseca Jr, J ; Eleoterio, M A S ; Souza-Neto, N M
  • Assuntos: Magnetic spectroscopy ; Optimization ; Physics ; Synchrotron radiation ; Synchrotrons ; X ray imagery
  • É parte de: Journal of physics. Conference series, 2020-08, Vol.1609 (1), p.12015
  • Descrição: Experimentally achieving extreme thermodynamical conditions of temperature, pressure and magnetic field such as the ones found in the interior of planets and stars has been a dream to many scientists seeking to reproduce those conditions on earth to study and produce unconventional materials. The advent of the 4th generation Brazilian synchrotron source (named after the "Sirius" star) allows us to get closer to this dream by implementing a state-of-the-art beamline facility to study samples under extreme thermodynamical conditions by means of a multitude of synchrotron x-ray techniques. The EMA Beamline (Extreme condition Methods of Analysis) will be able to do this by coupling both microfocus (1x1 µm2) and nanofocus (100x100 nm2) beamsizes to x-ray magnetic spectroscopy, x-ray diffraction and x-ray coherent imaging in multiple experimental instruments, placed along the beam path for optimization. Support laboratories (thermodynamical conditions, nuclear materials, laser and optics) were also planned to fulfil all requirements for the experiments under extreme. The EMA beamline, as overviewed here, should open a plethora of opportunities for diverse studies of materials at extreme conditions with synchrotron x-ray techniques.
  • Editor: Bristol: IOP Publishing
  • Idioma: Inglês

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