Moving current filaments in integrated DMOS transistors under short-duration current stress

DENISON, Marie ; BLAHO, Matej ; RODIN, Pavel ; DUBEC, Viktor ; POGANY, Dionyz ; SILBER, Dieter ; GORNIK, Erich ; STECHER, Matthias

IEEE transactions on electron devices, 2004, Vol.51 (10), p.1695-1703 [Periódico revisado por pares]

New York, NY: Institute of Electrical and Electronics Engineers

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