Characterization of Dopamine−Melanin Growth on Silicon Oxide

Bernsmann, Falk ; Ponche, Arnaud ; Ringwald, Christian ; Hemmerlé, Joseph ; Raya, Jesus ; Bechinger, Burkhard ; Voegel, Jean-Claude ; Schaaf, Pierre ; Ball, Vincent

Journal of physical chemistry. C, 2009-05, Vol.113 (19), p.8234-8242 [Periódico revisado por pares]

American Chemical Society

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