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Variational-state quantum metrology

Koczor, Bálint ; Endo, Suguru ; Jones, Tyson ; Matsuzaki, Yuichiro ; Benjamin, Simon C

New journal of physics, 2020-08, Vol.22 (8), p.83038 [Periódico revisado por pares]

Bristol: IOP Publishing

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Título:
Variational-state quantum metrology
Autor: Koczor, Bálint ; Endo, Suguru ; Jones, Tyson ; Matsuzaki, Yuichiro ; Benjamin, Simon C
Assuntos: Algorithms ; Background noise ; Computer peripherals ; Computers ; Entangled states ; Environment models ; Error correction & detection ; Experiments ; Magnetic fields ; Metrology ; Noise ; Permutations ; Physics ; quantum algorithms ; Quantum computing ; Quantum entanglement ; quantum information processing ; quantum metrology ; quantum sensing ; quantum simulation ; Qubits (quantum computing) ; Sensors
É parte de: New journal of physics, 2020-08, Vol.22 (8), p.83038
Notas: NJP-111656.R2
Descrição: Quantum technologies exploit entanglement to enhance various tasks beyond their classical limits including computation, communication and measurements. Quantum metrology aims to increase the precision of a measured quantity that is estimated in the presence of statistical errors using entangled quantum states. We present a novel approach for finding (near) optimal states for metrology in the presence of noise, using variational techniques as a tool for efficiently searching the high-dimensional space of quantum states, which would be classically intractable. We comprehensively explore systems consisting of up to 9 qubits and find new highly entangled states that are not symmetric under permutations and non-trivially outperform previously known states up to a constant factor 2. We consider a range of environmental noise models; while passive quantum states cannot achieve a fundamentally superior scaling (as established by prior asymptotic results) we do observe a significant absolute quantum advantage. We finally outline a possible experimental setup for variational quantum metrology which can be implemented in near-term hardware.
Editor: Bristol: IOP Publishing
Idioma: Inglês

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Variational-state quantum metrology

Koczor, Bálint ; Endo, Suguru ; Jones, Tyson ; Matsuzaki, Yuichiro ; Benjamin, Simon C

Bristol: IOP Publishing

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