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Morphological analysis of poly(o-methoxyaniline) thin-films deposited by spin coating technique

LIMA, John Paul H ; DE ANDRADE, Adnei M

Journal of materials science. Materials in electronics, 2006-08, Vol.17 (8), p.593-596 [Periódico revisado por pares]

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Título:
Morphological analysis of poly(o-methoxyaniline) thin-films deposited by spin coating technique
Autor: LIMA, John Paul H ; DE ANDRADE, Adnei M
Assuntos: Applied sciences ; Atomic force microscopy ; Conducting polymers ; Deposition ; Electronics ; Exact sciences and technology ; Materials ; Power law ; Spin coating ; Surface roughness ; Thin films
É parte de: Journal of materials science. Materials in electronics, 2006-08, Vol.17 (8), p.593-596
Notas: ObjectType-Article-2
SourceType-Scholarly Journals-1
ObjectType-Feature-1
content type line 23
Descrição: Morphological study of conducting polymer thin films obtained by spin coating is reported. Poly(o-methoxyaniline) films were deposited onto glass substrates and analyzed by profilometry and atomic force microscopy (AFM). It is shown that final thickness is correlated by a power law with spin speed with a solution concentration varying coefficient and that surface roughness decreases with increasing spin speed.
Editor: Norwell, MA: Springer
Idioma: Inglês

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