A Novel Technique for Optimal Feature Selection in Attribute Profiles Based on Genetic Algorithms
Pedergnana, M. ; Marpu, P. R. ; Mura, M. D. ; Benediktsson, J. A. ; Bruzzone, L.
IEEE transactions on geoscience and remote sensing, 2013-06, Vol.51 (6), p.3514-3528 [Periódico revisado por pares]New York, NY: IEEE
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