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Re-examining the Unified Theory of Acceptance and Use of Technology (UTAUT): Towards a Revised Theoretical Model

Dwivedi, Yogesh K. ; Rana, Nripendra P. ; Jeyaraj, Anand ; Clement, Marc ; Williams, Michael D.

Information systems frontiers, 2019-06, Vol.21 (3), p.719-734 [Revista revisada por pares]

New York: Springer US

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Título:
Re-examining the Unified Theory of Acceptance and Use of Technology (UTAUT): Towards a Revised Theoretical Model
Autor: Dwivedi, Yogesh K. ; Rana, Nripendra P. ; Jeyaraj, Anand ; Clement, Marc ; Williams, Michael D.
Materias: Business and Management ; Control ; Information systems ; Information technology ; IT in Business ; Management of Computing and Information Systems ; Meta-analysis ; Operations Research/Decision Theory ; Structural equation modeling ; Systems Theory ; Technology utilization ; Theory
Es parte de: Information systems frontiers, 2019-06, Vol.21 (3), p.719-734
Descripción: Based on a critical review of the Unified Theory of Acceptance and Use of Technology (UTAUT), this study first formalized an alternative theoretical model for explaining the acceptance and use of information system (IS) and information technology (IT) innovations. The revised theoretical model was then empirically examined using a combination of meta-analysis and structural equation modelling (MASEM) techniques. The meta-analysis was based on 1600 observations on 21 relationships coded from 162 prior studies on IS/IT acceptance and use. The SEM analysis showed that attitude: was central to behavioural intentions and usage behaviours, partially mediated the effects of exogenous constructs on behavioural intentions, and had a direct influence on usage behaviours. A number of implications for theory and practice are derived based on the findings.
Editor: New York: Springer US
Idioma: Inglés

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Re-examining the Unified Theory of Acceptance and Use of Technology (UTAUT): Towards a Revised Theoretical Model

Dwivedi, Yogesh K. ; Rana, Nripendra P. ; Jeyaraj, Anand ; Clement, Marc ; Williams, Michael D.

New York: Springer US

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