Analytical modelling and verification of potential profile of DG JLFET with and without stack oxide

Haque, Md. Mahfuzul ; Kabir, Md. Humaun ; Adnan, Md. Mohsinur Rahman

International journal of electronics, 2021-05, Vol.108 (5), p.819-840 [Periódico revisado por pares]

Abingdon: Taylor & Francis

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