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Identification and authentication of integrated circuits

Gassend, Blaise ; Lim, Daihyun ; Clarke, Dwaine ; van Dijk, Marten ; Devadas, Srinivas

Concurrency and computation, 2004-09, Vol.16 (11), p.1077-1098 [Periódico revisado por pares]

Chichester, UK: John Wiley & Sons, Ltd

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  • Título:
    Identification and authentication of integrated circuits
  • Autor: Gassend, Blaise ; Lim, Daihyun ; Clarke, Dwaine ; van Dijk, Marten ; Devadas, Srinivas
  • Assuntos: authentication ; identification ; physical random function ; physical security ; smartcard ; tamper resistance ; unclonability
  • É parte de: Concurrency and computation, 2004-09, Vol.16 (11), p.1077-1098
  • Notas: ark:/67375/WNG-10WHWJ24-1
    ArticleID:CPE805
    istex:DACEB87196FCB22A0DE9BAB04868F52A7EB3CF26
    ObjectType-Article-2
    SourceType-Scholarly Journals-1
    ObjectType-Feature-1
    content type line 23
  • Descrição: This paper describes a technique to reliably and securely identify individual integrated circuits (ICs) based on the precise measurement of circuit delays and a simple challenge–response protocol. This technique could be used to produce key‐cards that are more difficult to clone than ones involving digital keys on the IC. We consider potential venues of attack against our system, and present candidate implementations. Experiments on Field Programmable Gate Arrays show that the technique is viable, but that our current implementations could require some strengthening before it can be considered as secure. Copyright © 2004 John Wiley & Sons, Ltd.
  • Editor: Chichester, UK: John Wiley & Sons, Ltd
  • Idioma: Inglês

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